Materials characterization by synchrotron x-ray microprobes and nanoprobes

In the last years synchrotron x-ray microprobes and nanoprobes are emerging as key characterization tools with a remarkable impact for different scientific fields ranging from solid state physics to biology and cultural heritage. This review provides a comparison of the different probes available for the space-resolved characterization of materials (i.e. photons, electrons, ions, neutrons) with particular emphasis on x-rays. Subsequently, an overview of the optics employed to focus x-rays and of the most relevant characterization techniques using x-rays (i.e. XRD, WAXS, SAXS, XAS, XRF, XEOL, PES) is reported. Strategies suitable to minimize possible radiation damage induced by brilliant focused x-ray beams are briefly discussed. The general concepts are then exemplified by a selection of significant applications of x-ray microbeams and nanobeams to materials science. Finally, the future perspectives for the development of nanoprobe science at synchrotron sources and free electron lasers are discussed.