CINECA IRIS Institutional Research Information System

Digital pixel test structures implemented in a 65 nm CMOS process

Aglieri Rinella, Gianluca;Andronic, Anton;Antonelli, Matias;Aresti, Mauro;Baccomi, Roberto;Becht, Pascal;Beole, Stefania;Braach, Justus;Buckland, Matthew Daniel;Buschmann, Eric;Camerini, Paolo;Carnesecchi, Francesca;Cecconi, Leonardo;Charbon, Edoardo;Contin, Giacomo;Dannheim, Dominik;de Melo, Joao;Deng, Wenjing;di Mauro, Antonello;Hasenbichler, Jan;Hillemanns, Hartmut;Hong, Geun Hee;Isakov, Artem;Junique, Antoine;Kluge, Alex;Kotliarov, Artem;Křížek, Filip;Lautner, Lukas;Mager, Magnus;Marras, Davide;Martinengo, Paolo;Masciocchi, Silvia;Menzel, Marius Wilm;Munker, Magdalena;Piro, Francesco;Rachevski, Alexandre;Rebane, Karoliina;Reidt, Felix;Russo, Roberto;Sanna, Isabella;Sarritzu, Valerio;Senyukov, Serhiy;Snoeys, Walter;Sonneveld, Jory;Šuljić, Miljenko;Svihra, Peter;Tiltmann, Nicolas;Usai, Gianluca;Van Beelen, Jacob Bastiaan;Vassilev, Mirella Dimitrova;Vernieri, Caterina;Villani, Anna

2023-01-01