Characterisation of the FBK EXFLU1 thin sensors with gain in a high fluence environment

The EXFLU1 batch of LGAD sensors on substrates of thickness between 15 and 45 μm were exposed to various radiation grades between 1 × 10^14 and 5 × 10^15 neqcm−2 using the TRIGA Mark II research nuclear reactor at the Jozef Stefan Institute. The sensor designs are optimised to preserve characteristics at high fluences. These sensors are manufactured by Fondazione Bruno Kessler. The latest studies of the effects of radiation have been performed, with particular focus on acceptor removal and gain evolution.