We have determined the modulation parameters of the x-ray fringes emitted by a scanning symmetric LLL x-ray interferometer in order to estimate the contributions - in the budget of systematic errors related to the value of the Si d(220) lattice parameter - made by aberrations occurring during a non-ideal trajectory of the movable component. We have followed the Takagi approach to the dynamic theory of x-ray diffraction and used a computational tool which solves the relevant equations for any wavefront, for any absorption of the incident radiation and for the most common geometric configurations.
THE TAKAGI EQUATIONS IN EVALUATING THE CONTRIBUTIONS OF SOME SYSTEMATIC-ERRORS IN SCANNING LLL X-RAY INTERFEROMETERS
VITTONE, Ettore;ZOSI, Gianfranco
1994-01-01
Abstract
We have determined the modulation parameters of the x-ray fringes emitted by a scanning symmetric LLL x-ray interferometer in order to estimate the contributions - in the budget of systematic errors related to the value of the Si d(220) lattice parameter - made by aberrations occurring during a non-ideal trajectory of the movable component. We have followed the Takagi approach to the dynamic theory of x-ray diffraction and used a computational tool which solves the relevant equations for any wavefront, for any absorption of the incident radiation and for the most common geometric configurations.
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