We report new evidences for the thermodynamic instability of whisker crystals in the Bi–Sr–Ca–Cu–O (BSCCO) system. Annealing treatments at 90°C have been performed on two sets of samples, which were monitored by means of X-Rays Diffraction (XRD) and Atomic Force Microscopy (AFM) measurements, respectively. Two main crystalline domains of Bi2Sr2CuCa2O8+x (Bi-2212) were identified in the samples by the XRD data, which underwent an evident crystalline segregation after about 60 hours. Very fast dynamics of the surface modifications was also described by the AFM monitoring. Two typologies of surface structures formed after about 3 annealing hours: continuous arrays of dome shaped bodies were observed along the edges of the whiskers, while in the central regions a dense texture of flat bodies was found. These modifications are described in terms of the formation of simple oxide clusters involving a degradation of the internal layers.

Crystalline instability of Bi-2212 superconducting whiskers near room temperature

CAGLIERO, Stefano;AGOSTINO, Angelo;RAHMAN KHAN, Mohammad Mizanur;TRUCCATO, Marco;
2009

Abstract

We report new evidences for the thermodynamic instability of whisker crystals in the Bi–Sr–Ca–Cu–O (BSCCO) system. Annealing treatments at 90°C have been performed on two sets of samples, which were monitored by means of X-Rays Diffraction (XRD) and Atomic Force Microscopy (AFM) measurements, respectively. Two main crystalline domains of Bi2Sr2CuCa2O8+x (Bi-2212) were identified in the samples by the XRD data, which underwent an evident crystalline segregation after about 60 hours. Very fast dynamics of the surface modifications was also described by the AFM monitoring. Two typologies of surface structures formed after about 3 annealing hours: continuous arrays of dome shaped bodies were observed along the edges of the whiskers, while in the central regions a dense texture of flat bodies was found. These modifications are described in terms of the formation of simple oxide clusters involving a degradation of the internal layers.
95
479
484
BI2SR2CACU2O8+DELTA STACKED JUNCTIONS; INTRINSIC JOSEPHSON-JUNCTIONS; OXYGEN-CONTENT; GROWTH; DEFECTS; AFM; Surface characterization; oxide clusters; c-axis
S. Cagliero; A. Agostino; M. M. R. Khan; M. Truccato; F. Orsini; M. Marinone; G. Poletti; A. Lascialfari
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2318/62682
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