Direct evidence is reported of structural and electronic effects induced on a single Bi2Sr2CaCu2O8+delta (Bi-2212) whisker during a progressive annealing process. The crystal was investigated by micro X-ray diffraction (micro-XRD), micro X-ray fluorescence and electrical characterization at the European Synchrotron Radiation Facility, during a series of three in situ thermal processes at 363 K. Each step increased the sample resistivity and decreased its critical temperature, up to a semiconducting behaviour. These data correlate with micro-XRD analysis, which shows an increase of the c-axis parameter from 30.56 A ˚ to 30.75 A˚ , indicating an oxygen depletion mechanism. Mild temperature annealing could be an effective process to modulate the intrinsic Josephson junctions’ characteristics in Bi-2212 whiskers

Synchrotron study of oxygen depletion in a Bi-2212 whisker annealed at 363 K

CAGLIERO, Stefano;PIOVANO, ANDREA;LAMBERTI, Carlo;RAHMAN KHAN, Mohammad Mizanur;AGOSTINO, Angelo;AGOSTINI, Giovanni;GIANOLIO, DIEGO;MINO, LORENZO;MANFREDOTTI, Chiara;TRUCCATO, Marco
2009

Abstract

Direct evidence is reported of structural and electronic effects induced on a single Bi2Sr2CaCu2O8+delta (Bi-2212) whisker during a progressive annealing process. The crystal was investigated by micro X-ray diffraction (micro-XRD), micro X-ray fluorescence and electrical characterization at the European Synchrotron Radiation Facility, during a series of three in situ thermal processes at 363 K. Each step increased the sample resistivity and decreased its critical temperature, up to a semiconducting behaviour. These data correlate with micro-XRD analysis, which shows an increase of the c-axis parameter from 30.56 A ˚ to 30.75 A˚ , indicating an oxygen depletion mechanism. Mild temperature annealing could be an effective process to modulate the intrinsic Josephson junctions’ characteristics in Bi-2212 whiskers
JOURNAL OF SYNCHROTRON RADIATION
16
813
817
http://journals.iucr.org/s/issues/2009/06/00/issconts.html
superconductor; microfocused X-ray beam; Bi-2212; whisker; THz; oxygen doping; Kirkpatrick–Baez mirrors; micro-XRF; micro-XRD; c-axis; conductivity
S. Cagliero; A. Piovano; C. Lamberti; M. M. Rahman Khan; A. Agostino; G. Agostini; D. Gianolio; L. Mino; J. A. Sans; Ch. Manfredotti; M. Truccato
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Utilizza questo identificativo per citare o creare un link a questo documento: http://hdl.handle.net/2318/62683
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