This paper estimates the international diffusion of technical knowledge using patent citations. We control for self-citations and for procedural differences between patent offices using equivalent patents. We find that (1) there are clear biases in patent examination processes that generate citations in the two offices; (2) at the EPO there is a strong localization effect at the country level, and the size is comparable to that found at the USPTO; (3) technological fields have different properties of diffusion in the two patent offices that do not depend on a patent office bias; (4) using EPO data, the US is not the leading country in terms of citations made and received, as occurs at the USPTO.

International knowledge diffusion and home-bias effect. Do USPTO & EPO patent citations tell the same story?

MONTOBBIO, Fabio
2010-01-01

Abstract

This paper estimates the international diffusion of technical knowledge using patent citations. We control for self-citations and for procedural differences between patent offices using equivalent patents. We find that (1) there are clear biases in patent examination processes that generate citations in the two offices; (2) at the EPO there is a strong localization effect at the country level, and the size is comparable to that found at the USPTO; (3) technological fields have different properties of diffusion in the two patent offices that do not depend on a patent office bias; (4) using EPO data, the US is not the leading country in terms of citations made and received, as occurs at the USPTO.
2010
112(3)
441
470
Knowledge flows; spillovers; diffusion; patents; patent citations
E. BACCHIOCCHI;F. MONTOBBIO
File in questo prodotto:
File Dimensione Formato  
Bacchiocchi_Montobbio_sje_2010.pdf

Accesso riservato

Tipo di file: PDF EDITORIALE
Dimensione 320.17 kB
Formato Adobe PDF
320.17 kB Adobe PDF   Visualizza/Apri   Richiedi una copia
SJE_OPEN_ACCESS_4aperto_677852.pdf

Accesso aperto

Tipo di file: POSTPRINT (VERSIONE FINALE DELL’AUTORE)
Dimensione 249.88 kB
Formato Adobe PDF
249.88 kB Adobe PDF Visualizza/Apri

I documenti in IRIS sono protetti da copyright e tutti i diritti sono riservati, salvo diversa indicazione.

Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2318/99808
Citazioni
  • ???jsp.display-item.citation.pmc??? ND
  • Scopus 66
  • ???jsp.display-item.citation.isi??? 63
social impact