Recent results on diamond radiation tolerance

Seidel, S.; Artuso, M.; Bachmair, F.; Bani, L.; Bartosik, M.; Beacham, J.; Bellini, V.; Belyaev, V.; Bentele, B.; Berdermann, E.; Bergonzo, P.; Bes, A.; Brom, J. M.; Bruzzi, M.; Cerv, M.; Chau, C.; Chiodini, G.; Chren, D.; Cindro, V.; Claus, G.; Collot, J.; Costa, S.; Cumalat, J.; Dabrowski, A.; D’Alessandro, R.; de Boer, W.; Dehning, B.; Dobos, D.; Dunser, M.; Dulinski, W.; Eremin, V.; Eusebi, R.; Forcolin, G.; Forneris, Jacopo; Frais Kolb, H.; Gan, K. K.; Gastal, M.; Goffe, M.; Goldstein, J.; Golubev, A.; Gonella, L.; Gorisek, A.; Graber, L.; Grigoriev, E.; Grosse Knetter, J.; Guthoff, M.; Haughton, I.; Hidas, D.; Hits, D.; Hoeferkamp, M.; Hofmann, T.; Hosslet, J.; Hostachy, J. Y.; Hugging, F.; Jansen, H.; Janssen, J.; Kagan, H.; Kanxheri, K.; Kasieczka, G.; Kass, R.; Kassel, F.; Kis, M.; Kramberger, G.; Kuleshov, S.; Lacoste, A.; Lagomarsino, S.; LO GIUDICE, Alessandro; Maazouzi, C.; Mandic, I.; Manfredotti, C.; Mathieu, C.; Mcfadden, N.; Mcgoldrick, G.; Menichelli, M.; Mikuz, M.; Morozzi, A.; Moss, J.; Mountain, R.; Murphy, S.; Oakham, G.; Oh, A.; Olivero, P.; Parrini, G.; Passeri, D.; Pauluzzi, M.; Pernegger, H.; Perrino, R.; Picollo, Federico; Pomorski, M.; Potenza, R.; Quadt, A.; Re, A.; Riley, G.; Roe, S.; Sapinski, M.; Scaringella, M.; Schnetzer, S.; Schreiner, T.; Sciortino, S.; Scorzoni, A.; Servoli, L.; Sfyrla, A.; Shimchuk, G.; Smith, S.; Sopko, B.; Sopko, V.; Spagnolo, S.; Spanier, S.; Stenson, K.; Stone, R.; Sutera, C.; Taylor, A.; Traeger, M.; Tromson, D.; Trischuk, W.; Tuve, C.; Uplegger, L.; Velthuis, J.; Venturi, N.; Vittone, Ettore; Wagner, S.; Wallny, R.; Wang, J. C.; Weilhammer, P.; Weingarten, J.; Weiss, C.; Wengler, T.; Wermes, N.; Yamouni, M.; Zavrtanik, M.

doi:10.1088/1748-0221/9/01/C01013

Results are presented on two topics associated with prediction and measurement of the radiation hardness of diamond sensors in environments relevant to detector tracking systems at the HL-LHC. In the first suite of studies, diamond sensors are exposed to particle beams of a variety of energies and species. The damage incurred is compared to predictions by the Monte Carlo simulation package FLUKA incorporating the number of displacements per atom (DPA) according to the model by Norgert, Robinson, and Torrens. In the second study, the resistivity of polycrystalline chemical vapor deposition diamond sensors is inferred from measurements of the leakage current for a range of bias voltages on samples irradiated with 800 MeV protons up to 1.6 × 1016 p/cm2. The devices' resistivity is extracted for temperatures in the −10°C to +20°C range and found to be independent of fluence and temperature over the ranges studied.