Carbon has different allotropic forms at ambient conditions with radically different structural and electrical properties (most importantly, diamond and graphite): this peculiarity allows the fabrication of all-carbon devices for various technological applications. In this context, the employment of focused MeV ion beams in diamond is a versatile tool to create different structural forms of carbon by the progressive conversion of the sp 3-bonded diamond lattice to a sp2-bonded amorphous /graphitic phase. The use of variable-thickness masks on the diamond surface allows the tuning of the ion penetration depth in order to realize channels with emerging endpoints, with several applications in radiation detection, bio-sensing and color center emission [1-3]. In the present paper we report about the Conductive Atomic Force Microscopy (C-AFM) characterization of the emerging areas of buried graphitic channels.

Conductive-AFM study of emerging graphitic channels implanted in CVD diamond

A. Battiato;E. Bernardi;D'ITALIA, SERENA;J. Forneris;F. Picollo;A. Tengattini;P. Olivero
2016-01-01

Abstract

Carbon has different allotropic forms at ambient conditions with radically different structural and electrical properties (most importantly, diamond and graphite): this peculiarity allows the fabrication of all-carbon devices for various technological applications. In this context, the employment of focused MeV ion beams in diamond is a versatile tool to create different structural forms of carbon by the progressive conversion of the sp 3-bonded diamond lattice to a sp2-bonded amorphous /graphitic phase. The use of variable-thickness masks on the diamond surface allows the tuning of the ion penetration depth in order to realize channels with emerging endpoints, with several applications in radiation detection, bio-sensing and color center emission [1-3]. In the present paper we report about the Conductive Atomic Force Microscopy (C-AFM) characterization of the emerging areas of buried graphitic channels.
LNL Annual Reports 2015
INFN Legnaro National Laboratories
2015
148
149
http://www.lnl.infn.it/~annrep/read_ar/2015/contributions/pdfs/148_D_84_D079.pdf
A. Battiato; E. Bernardi; S. Ditalia; J. Forneris; L. La Torre; F. Picollo; V. Rigato; A. Tengattini; P. Olivero
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2318/1660594
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