CVD diamond, as other wide energy gap semiconductors or insulators, is known to present polarization effects when used as a nuclear particle detector, which are due to the building up of an internal space-charge electric field and are responsible for “memory“ effects if the polarization is not erased. A strong trapping induced on both carriers, i. e. priming or pumping, is used in order to try to stabilize diamond before its use as a nuclear detector. Polarization effects are larger when the thickness of the sample is longer than the drift length of carriers and give rise to a shortening of the electric field region inside the sample. In this work, IBIC (Ion Beam Induced Charge) measurements with 1 and 2 MeV proton beams have been carried out on a relatively thin CVD diamond sample with the conclusion that no memory or hysteresis effects were present even by switching from one polarity to the opposite one in subsequent measurements. However, it resulted that the values of the charge collection efficiency (cce) did depend on counting rate and the lowering at large counting rates was attributed to a local polarization due to trapping.

Memory effects in CVD diamond detectorsin LNL Annual Report 2005

LO GIUDICE, Alessandro;COLOMBO, Elisabetta;MANFREDOTTI, Claudio;VITTONE, Ettore;
2005-01-01

Abstract

CVD diamond, as other wide energy gap semiconductors or insulators, is known to present polarization effects when used as a nuclear particle detector, which are due to the building up of an internal space-charge electric field and are responsible for “memory“ effects if the polarization is not erased. A strong trapping induced on both carriers, i. e. priming or pumping, is used in order to try to stabilize diamond before its use as a nuclear detector. Polarization effects are larger when the thickness of the sample is longer than the drift length of carriers and give rise to a shortening of the electric field region inside the sample. In this work, IBIC (Ion Beam Induced Charge) measurements with 1 and 2 MeV proton beams have been carried out on a relatively thin CVD diamond sample with the conclusion that no memory or hysteresis effects were present even by switching from one polarity to the opposite one in subsequent measurements. However, it resulted that the values of the charge collection efficiency (cce) did depend on counting rate and the lowering at large counting rates was attributed to a local polarization due to trapping.
http://www.lnl.infn.it/~annrep/index.htm
IBIC; Ion Beam Analysis; diamond; detector
A. Lo Giudice; Y. Garino; E. Colombo; C. Manfredotti; E. Vittone; F. Fizzotti; E. Pace
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2318/55688
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