We have measured the temperature dependence of resistivity in relatively thick Nb/Al bilayers fabricated at room temperature, observing the decrease of rho for increasing T typical of Anderson localization in disordered systems. We report the experimental conditions which determine this behavior and compare it to theoretical models for localization in 3D systems.

Anderson localization in Nb/Al superconducting bilayers

GRECO, Michela;MENICHETTI, Ezio;
2000-01-01

Abstract

We have measured the temperature dependence of resistivity in relatively thick Nb/Al bilayers fabricated at room temperature, observing the decrease of rho for increasing T typical of Anderson localization in disordered systems. We report the experimental conditions which determine this behavior and compare it to theoretical models for localization in 3D systems.
2000
118
75
89
GRANULAR AL-GE; INSULATOR TRANSITION; METAL-FILMS; CONDUCTION ELECTRONS; 2 DIMENSIONS; THIN-FILMS; PB FILMS; RESISTIVITIES; LA2-XSRXCUO4; TEMPERATURE
M. Greco;V. Lacquaniti;S. Maggi;E. Menichetti;G. Rinaudo
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Utilizza questo identificativo per citare o creare un link a questo documento: https://hdl.handle.net/2318/109827
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